RANCANG BANGUN ALAT UKUR RESISTIVITAS PADA LAPISAN TIPIS MENGGUNAKAN METODE 4 PROBE BERBASIS ATMEGA8535 DENGAN TAMPILAN LCD KARAKTER 2 X 16

Authors

  • Juwita Safitri Jurusan Fisika FMIPA Universitas Andalas
  • Meqorry Yusfi
  • Astuti -

DOI:

https://doi.org/10.25077/jfu.3.2.65-73.2014

Abstract

ABSTRAK

Telah dilakukan rancang bangun alat ukur resistansi lapisan tipis yang dapat mengukur resistansi suatu bahan berukuran sangat kecil dan sangat tipis.  Sistem pengukuran nilai resistansi menggunakan metode 4 probe.  Lapisan tipis diuji dengan pemberian variasi arus.  Empat buah probe diletakkan diatas permukaan lapisan tipis.  Dua buah probe diletakkan di luar untuk memberikan arus masukan dan dua probe diletakkan di dalam untuk menghasilkan tegangan keluaran pada lapisan tipis.  Hasil keluaran dari metode 4 probe adalah berupa nilai tegangan dalam orde mV.  Penguat instrumentasi  digunakan untuk memperkuat nilai tegangan tersebut dengan penguatan sebesar 1000 kali dan diproses dengan mikrokontroler ATMega8535.  Pemroses kerja mikrokontroler menggunakan bahasa pemograman Bascom dengan nilai yang diperoleh dari data ADC.  Pengukuran nilai resistansi dilakukan pada beberapa lapisan tipis yaitu lapisan TiO2 cair dan lapisan TiO2 serbuk.

Kata kunci : metode 4 probe, ATMega8535, resistansi, penguat instrumentasi

ABSTRACT

Already design the instrument measuring of thin film resistance which can measure the resistance of a very small and thin material.  The value of measurement system is four probes method. A thin layer was tested by given the current variation. Four probeswere placed on the surface of thin layer.  Two probes were placed outside thin layer to provide the input current and two probes were placed inside to produce the output voltage of thin layer . The output from the four probe method is a voltage value in mV range.  Instrumentation gained were used is an instrumentation amplifier gain for amplify the voltage value with 1000 times of gain and processed by a ATMega8535 microcontroller. Microcontroller process works by using Bascom programming with the values from the ADC result. Value of resistance measurement performed on several thin layers,like TiO2 liquid layer and TiO2 powder layer .

Keywords : 4 probe method , ATMega8535 , resistance , instrumentation amplifier

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Published

2024-10-26

How to Cite

Safitri, J., Yusfi, M., & -, A. (2024). RANCANG BANGUN ALAT UKUR RESISTIVITAS PADA LAPISAN TIPIS MENGGUNAKAN METODE 4 PROBE BERBASIS ATMEGA8535 DENGAN TAMPILAN LCD KARAKTER 2 X 16. Jurnal Fisika Unand, 3(2), 65–73. https://doi.org/10.25077/jfu.3.2.65-73.2014

Issue

Vol. 3 No. 2: April 2014

Section

Articles

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Copyright (c) 2024 Juwita Safitri, Meqorry Yusfi, Astuti -

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